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09 / 2012 - sentronics metrology presents: High Speed Wafer Metrology and Sorting System with Multi Sensor Technology

sentronics metrology has now enhanced the form and function of the already existing fully-automated wafer inspection systems: for example the newly engineered SemDex A with advanced design.
It is not only a powerful high speed metrology device but also a wafer sorter combined in one system. Therefore, SemDex A has now successfully captured the demand of the Asian market.

08 / 2016 - sentronics metrology at Semicon Taiwan

No other event in Taiwan gives you more access to buyers and decision-makers than SEMICON Taiwan.
It is the region’s number-one platform for showcasing products, demonstrating market and technology leadership, and engaging buyers from every one of Taiwan’s leading microelectronics companies.

Sept 7-9, 2016, Taipei Nangang Exhibition Center, Taipei, Taiwan at JC's Chunson Limited, Booth#220

 

 

03 / 2015 - ISIS sentronics -> becomes sentronics metrology

In order to clearly reflect the business activities of ISIS sentronics GmbH, the company has changed its name to sentronics metrology GmbH
No other company-related changes have been made.

Non-contact Optical Metrology Systems for Quality Assurance

Welcome to sentronics metrology GmbH

sentronics metrology is world leader in non-contact, non-invasive optical metrology. For over six years sentronics metrology has been developing and marketing systems for seamless monitoring of quality processes in the areas of: wafers, automotive and coatings/ films.

Sensors developed by sentronics metrology on the basis of optical interferometry and the company’s turnkey inspection systems for quality assurance all permit three-dimensional measurements, either of material thicknesses or of surface topographies, including roughness values.