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09 / 2012 - sentronics metrology presents: The New Generation of Fully-automated High Speed Wafer Metrology Systems

sentronics metrology has now enhanced the form and function of the already existing fully-automated wafer inspection systems: for example the newly engineered SemDex A with advanced design.
It is not only a powerful high speed metrology device but also a wafer sorter combined in one system. Therefore, SemDex A has now successfully captured the demand of the Asian market.

05 / 2015 - sentronics metrology at Semicon West 2015

Semicon West, 14.-16. July
Moscone Center, San Francisco
South Hall, 2221

More than semiconductors, SEMICON West is also showcase for emerging markets and technologies born from the microelectronics industry, including micro-electromechanical systems (MEMS), photovoltaics (PV), flexible electronics and displays, nano-electronics, solid state lighting (LEDs), and related technologies.

03 / 2015 - ISIS sentronics -> becomes sentronics metrology

In order to clearly reflect the business activities of ISIS sentronics GmbH, the company has changed its name to sentronics metrology GmbH
No other company-related changes have been made.

Non-contact Optical Metrology Systems for Quality Assurance

Welcome to sentronics metrology GmbH

sentronics metrology is world leader in non-contact, non-invasive optical metrology. For over six years sentronics metrology has been developing and marketing systems for seamless monitoring of quality processes in the areas of: wafers, automotive and coatings/ films.

Sensors developed by sentronics metrology on the basis of optical interferometry and the company’s turnkey inspection systems for quality assurance all permit three-dimensional measurements, either of material thicknesses or of surface topographies, including roughness values.