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09 / 2012 - sentronics metrology presents: High Speed Wafer Metrology and Sorting System with Multi Sensor Technology

sentronics metrology has now enhanced the form and function of the already existing fully-automated wafer inspection systems: for example the newly engineered SemDex A with advanced design.
It is not only a powerful high speed metrology device but also a wafer sorter combined in one system. Therefore, SemDex A has now successfully captured the demand of the Asian market.

02 / 2017 - sentronics metrology at ICE fair, Munich

ICE Europe is the world’s leading exhibition for the converting industry.
It offers its audience a comprehensive overview of the prevailing technological innovations and the latest manufacturing trends for the converting of flexible, web-based materials, such as paper, film, foil and nonwovens. 

21.-23. March 2017, Messe Munich
Hall A5, #880

02 / 2017 - sentronics metrology at Semicon China 2017

SEMICON China: Largest gathering of the semiconductor industry in the world
For 6 years in a row, SEMICON China has been the world's largest and most influential trade show for the semiconductor industry. It attracted the major players from the global semiconductor industry to Shanghai.

March 14-16,2017
Shanghai New International Expo Centre – visit us at Questar Ltd. booth #3619

 

Non-contact Optical Metrology Systems for Quality Assurance

Welcome to sentronics metrology GmbH

sentronics metrology is world leader in non-contact, non-invasive optical metrology. For over ten years sentronics metrology has been developing and marketing systems for seamless monitoring of quality processes in the areas of: wafers, automotive and coatings/ films.

Sensors developed by sentronics metrology on the basis of optical interferometry and the company’s turnkey inspection systems for quality assurance all permit three-dimensional measurements, either of material thicknesses or of surface topographies, including roughness values.