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09 / 2012 - sentronics metrology presents: The New Generation of Fully-automated High Speed Wafer Metrology Systems

sentronics metrology has now enhanced the form and function of the already existing fully-automated wafer inspection systems: for example the newly engineered SemDex A with advanced design.
It is not only a powerful high speed metrology device but also a wafer sorter combined in one system. Therefore, SemDex A has now successfully captured the demand of the Asian market.

03 / 2015 - ISIS sentronics -> becomes sentronics metrology

In order to clearly reflect the business activities of ISIS sentronics GmbH, the company has changed its name to sentronics metrology GmbH
No other company-related changes have been made.

12 / 2014 - sentronics metrology at ICE Europe, 2015

10. - 12. March 2015, Munich
Hall A5, 945

ICE Europe is the leading international exhibition for everybody involved in the conversion of flexible web materials such as paper, film, foil and nonwovens. The show brings suppliers of machines and systems for the converting sector together with industry specialists in search of the latest production solutions.

Non-contact Optical Metrology Systems for Quality Assurance

Welcome to sentronics metrology GmbH

sentronics metrology is world leader in non-contact, non-invasive optical metrology. For over six years sentronics metrology has been developing and marketing systems for seamless monitoring of quality processes in the areas of: wafers, automotive and coatings/ films.

Sensors developed by sentronics metrology on the basis of optical interferometry and the company’s turnkey inspection systems for quality assurance all permit three-dimensional measurements, either of material thicknesses or of surface topographies, including roughness values.