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09 / 2012 - sentronics metrology presents: High Speed Wafer Metrology and Sorting System with Multi Sensor Technology

sentronics metrology has now enhanced the form and function of the already existing fully-automated wafer inspection systems: for example the newly engineered SemDex A with advanced design.
It is not only a powerful high speed metrology device but also a wafer sorter combined in one system. Therefore, SemDex A has now successfully captured the demand of the Asian market.

10 / 2016 - sentronics metrology at Semicon Korea 2017

SEMICON Korea 2017 is one of the biggest events for semiconductor industry in Korea. The event will be the largest SEMICON Korea in its 30 year history in terms of its size as well as the number of exhibitors.

08 / 2016 - sentronics metrology at Semicon Taiwan

No other event in Taiwan gives you more access to buyers and decision-makers than SEMICON Taiwan.
It is the region’s number-one platform for showcasing products, demonstrating market and technology leadership, and engaging buyers from every one of Taiwan’s leading microelectronics companies.
Sept 7-9, 2016, Taipei Nangang Exhibition Center, Taipei, Taiwan at JC's Chunson Limited, Booth #220



Non-contact Optical Metrology Systems for Quality Assurance

Welcome to sentronics metrology GmbH

sentronics metrology is world leader in non-contact, non-invasive optical metrology. For over ten years sentronics metrology has been developing and marketing systems for seamless monitoring of quality processes in the areas of: wafers, automotive and coatings/ films.

Sensors developed by sentronics metrology on the basis of optical interferometry and the company’s turnkey inspection systems for quality assurance all permit three-dimensional measurements, either of material thicknesses or of surface topographies, including roughness values.