Skip navigation
Languages
Applikationsberichte

Application notes

Here you will find application notes about the use of our optical measurement systems in different environments. These stories describe precise measurering task, challenges and finally suggest suitable solutions.

If you have questions regarding these projects or similar cases please contact our sales team by phone +49/ 621 84251 210, fill in our contact form or send us an email to sales@sentronics-metrology.de.

Wafer

Measurement of Roughness Parameters on grinded and polished Wafers

Coatings/ Films

Precise measurement of single layers on double-sided adhesive layers

Innovative solution for measurement of varnish- and plasticcoatings on metal substrates

Innovative solution for layer thickness measurement of thermoplasticalelastomeres on nonwovens

Layer thickness measurement of thin adhesive layers and multiple layers