Skip navigation
ISIS sentronics - news


09 / 2012 - sentronics metrology presents: High Speed Wafer Metrology and Sorting System with Multi Sensor Technology

sentronics metrology has now enhanced the form and function of the already existing fully-automated wafer inspection systems: for example the newly engineered SemDex A with advanced design.
It is not only a powerful high speed metrology device but also a wafer sorter combined in one system. Therefore, SemDex A has now successfully captured the demand of the Asian market.

07 / 2011 - New thin film sensor StraDex t6-60

Using the new StraDex t6-60 it is possible to measure thinnest films down to 0.3 µm.

Syndicate content

Events / Trade Fairs

02 / 2018 - sentronics metrology at Semicon China 2018

SEMICON China connects you to the world’s fastest-growing and most dynamic microelectronics market, and gives you the platform to showcase your products, technologies, and brand in front of the most qualified audience of industry professionals in China.

March 14.-16.2018, Shanghai New International Expo Centre
German Pavillon, booth # 2571

12 / 2017 - sentronics metrology at Semicon Korea 2018

Since SEMICON Korea was launched in 1987, it has been advancing together with Korea semiconductor industry. SEMICON Korea is one of the biggest exhibition in Korean Semiconductor industry.

January 31(Wed) - February 2 (Fri), 2018
COEX, Seoul, Korea, booth # C664

08 / 2017 - sentronics metrology at Semicon Japan

First held in 1977, SEMICON Japan has grown to become one of the largest international exhibition of semiconductor equipment and materials. Bringing companies and their technologies together with customers and partners, as well as providing a setting for technical seminars and meetings, SEMICON Japan actively supports the growth of the global semiconductor industry.

Dec 13-15, 2017
Tokyo Big Sight Tokyo, Japan, booth # 1532


Syndicate content

Press releases

04 / 2012 - Multipunkt-Messungen zur automatisierten Qualitätssicherung auf der CONTROL 2012

sentronics metrology stellt auf der CONTROL 2012 (Halle 3 Stand 3310) das Innenraum-Inspektionssystem ‚i-Dex tf’ mit diversen neuen Features vor. 

09 / 2011 - sentronics metrology with new i-Dex t model

Für die industrielle Inspektion bietet sentronics metrology ein Innenraum-Inspektionssystem mit dem erweiterten Spektrum der i-Dex Reihe.

08 / 2011 - Semi-automatic 3D inspection system for shape and surface measurements

Die sentronics metrology GmbH in Mannheim hat mit dem i-Dex ta ein neues Messsystem mit berührungsloser, optischer Metrologie für 3D-Mikro-Topographien und 2D-Rauheiten an der Oberfläche entwickelt.

Syndicate content