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SemDex 101 nano

SemDex 101 nano

SemDex 101 with integrated thin film sensor StraDex t10

SemDex 101 nano

Semi-automatic table-top inspection system for measurement of ultra thin layers

• Straightforward manual loading
• Automatic measurement with programmable measuring protocols
• Compact table-top instrument with optimum footprint
• Optionally available high-resolution HD CMOS camera
• Calibration body integrated in chuck
• User-friendly StratoSpect software

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