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StraDex f

StraDex f

Layers and coatings of a few µm up to 0.8 mm
StraDex f
StraDex f
Layers and coatings of a few µm up to 0.8 mm
StraDex f
StraDex f
StraDex f
Very compact construction
StraDex f

StraDex f

Optical Sensors as Non-contact Alternatives for Measuring Layers/Coatings and Profiles

  • Layers and coatings of a few µm up to 0.8 mm
  • StraDex f2 – 80: Minimum layer thickness 5 µm (polymer) or 2.5 µm (silicon)
  • StraDex f24 – 300: Maximum layer thickness* of 0.8 mm (polymer) or 0.35 mm (silicon)
  • Repeatabilities: 10/ 100 nm (depending upon model)
  • Max. acquisition rate: 4000 measuring points per second
  • Very compact construction
  • User-friendly software: TopoSpekt, TopoLine
  • Optional: Integratable into external traversing devices or automation units

* Thicker layers can be measured but significantly reduce the data acquisition rate